Estimation of elastic strain by integrated image correlation on electron diffraction patterns.

Affiliation

Laboratoire de Mécanique et Technologie (LMT), ENS Paris-Saclay/CNRS/Université Paris-Saclay, 61 Avenue du Président Wilson, Cachan 94235, France; EDF R&D, Site des Renardières, Avenue des Renardières, Ecuelles, Moret-sur-Loing 77818, France. Electronic address: [Email]

Abstract

High-angular-resolution electron backscattered diffraction (HR-EBSD) has been developed to study local elastic strains in crystals. An integrated digital image correlation (DIC) procedure for high resolution diffraction patterns, as recently proposed to bypass several problems of the conventional cross-correlation-based algorithm, was implemented. Through two examples of experimental data where the algorithm was used and compared to conventional means, the current paper illustrates the benefits of the integrated DIC method. It is found that both measurement uncertainty and computation time were simultaneously reduced. Moreover, an enhanced robustness was obtained for relatively high misorientations relative to methods based on cross-correlation. Different computing conditions are explored on experimental data. A number of practical usage conditions are proposed to achieve better precision and speed.

Keywords

Crystal material strain,Deformation gradient tensor,High-angular-resolution EBSD,Integrated digital image correlation,Residual stress,

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